Lithography-free electrical transport measurements on 2D materials by direct microprobing

We present a method to carry out electrical and optoelectronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts with the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS...

Full description

Saved in:
Bibliographic Details
Published inJournal of materials chemistry. C, Materials for optical and electronic devices Vol. 5; no. 43; pp. 11252 - 11258
Main Authors Gant, Patricia, Niu, Yue, Svatek, Simon A., Agraït, Nicolás, Munuera, Carmen, García-Hernández, Mar, Frisenda, Riccardo, de Lara, David Perez, Castellanos-Gomez, Andres
Format Journal Article
LanguageEnglish
Published Cambridge Royal Society of Chemistry 2017
Subjects
Configuration management
Electric contacts
Flakes
Molybdenum disulfide
Optoelectronics
Transport
Two dimensional materials
Online AccessGet full text

Cover

More Information
Summary:We present a method to carry out electrical and optoelectronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts with the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS 2 flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS 2 devices fabricated by the conventional lithographic process. We also show that this method can be used with other 2D materials.
ISSN:2050-7526
2050-7534
DOI:10.1039/C7TC01203A