Total-Ionizing-Dose-Induced Body Current Lowering in the 130 nm PDSOI I/O NMOSFETs
The body current lowering effect of 130 nm partially depleted silicon-on-insulator (PDSOI) input/output (I/O) n-type metal-oxide-semiconductor field-effect transistors (NMOSFETs) induced by total-ionizing dose is observed and analyzed. The decay tendency of current ratio of body current and drain cu...
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Published in | Chinese physics letters Vol. 34; no. 1; pp. 16103 - 16106 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Chinese Physical Society and IOP Publishing Ltd
01.01.2017
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Subjects | |
Online Access | Get full text |
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Summary: | The body current lowering effect of 130 nm partially depleted silicon-on-insulator (PDSOI) input/output (I/O) n-type metal-oxide-semiconductor field-effect transistors (NMOSFETs) induced by total-ionizing dose is observed and analyzed. The decay tendency of current ratio of body current and drain current I b / I d is also investigated. Theoretical analysis and TCAD simulation results indicate that the physical mechanism of body current lowering effect is the reduction of maximum lateral electric field of the pinch-off region induced by the trapped charges in the buried oxide layer (BOX). The positive charges in the BOX layer can counteract the maximum lateral electric field to some extent. |
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ISSN: | 0256-307X 1741-3540 |
DOI: | 10.1088/0256-307X/34/1/016103 |