Improved Model of T-Type LC EMI Chip Filters Using New Microstrip Test Fixture

• Published in: IEEE transactions on magnetics Vol. 47; no. 10; pp. 3975 - 3978
• Main Authors: Menicanin, Aleksandar B., Damnjanovic, Mirjana S., Zivanov, Ljiljana D., Aleksic, Obrad S.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: New York, NY IEEE 01.10.2011; Institute of Electrical and Electronics Engineers
• Subjects: Cross-disciplinary physics: materials science; rheology; Electromagnetic interference; Electromagnetic interference (EMI); Exact sciences and technology; Inductors; Integrated circuit modeling; LC filters; Materials science; Microstrip; Microwave filters; modeling; Other topics in materials science; Physics; scattering parameters; Semiconductor device measurement; Solid modeling; test fixture; Electromagnetic interference (EMI); test fixture; modeling; Test method; Modelling; scattering parameters; Metal chip; LC filters; Magnetic properties
• ISSN: 0018-9464; 1941-0069
• DOI: 10.1109/TMAG.2011.2150738

In this paper we present an improved model of the multilayered T-type electromagnetic interference chip LC filter for printed circuit board applications, and an improved measurement technique for characterization of such devices. Electrical parameters measurements of the same LC filter can vary for different measurement types. Because of that, we have developed new adaptation microstrip test fixture on printed circuit board for vector network analyzers' measurements of surface mount devices with three terminals. Two commercially available components, multilayer T-type LC filters, are measured and characterized using a vector network analyzer. The comparison of measurement data and simulation values of electrical equivalent circuit and electromagnetic model for two LC filters is further presented. The new improved model of T-type LC filters has provided better agreement between measurement and simulation.