Computerized Control and Operation of Rutherford Backscattering/Channeling for an in situ Ion Beam System and Its Application for Measurement of Si(001) and ZnO(001)

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Bibliographic Details
Published inChinese physics letters Vol. 28; no. 1; p. 012901
Main Authors He, Jun (俊何), Lee, J. C. (李载 春), Li, Ming (明黎), Wang, Ze-Song (泽松 王), Liu, Chuan-Sheng (传胜 刘), Fu, De-Jun (德君 付)
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.01.2011
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ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/28/1/012901