Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology

This paper reports on the supply voltage dependency of single-event transient (SET) propagation and multinode charge collection phenomena in integrated circuits. We have found that the SET pulsewidth propagating to subsequent stages in a circuit may decrease with reduced power supply voltage, which...

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Bibliographic Details
Published inIEEE transactions on device and materials reliability Vol. 14; no. 1; pp. 139 - 145
Main Authors Qin, Junrui, Chen, Shuming, Liang, Bin, Ge, Zhen, He, Yibai, Du, Yankang, Liu, Biwei, Chen, Jianjun, Li, Dawei
Format Magazine Article
LanguageEnglish
Published New York IEEE 01.03.2014
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Multinode charge collection
Power generation
Power supplies
single-event transient (SET)
subthreshold
ultralow power voltage
Voltage control
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Summary:This paper reports on the supply voltage dependency of single-event transient (SET) propagation and multinode charge collection phenomena in integrated circuits. We have found that the SET pulsewidth propagating to subsequent stages in a circuit may decrease with reduced power supply voltage, which runs counter to the general conclusion that ultralow power applications are much more susceptible to disruption from a particle strike. This effect provides the circuit designers a guidance to reconsider the impact of voltage on SET pulsewidth.
ISSN:1530-4388
1558-2574
DOI:10.1109/TDMR.2013.2255597