Graphene Interconnect Lifetime: A Reliability Analysis

Understanding the breakdown current density is not enough for establishing the reliability performance of graphene interconnects. It is more important to know how graphene wires degrade with time under constant current stress and how that compares with conventional interconnects. This letter investi...

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Bibliographic Details
Published inIEEE electron device letters Vol. 33; no. 11; pp. 1604 - 1606
Main Authors Xiangyu Chen, Seo, D. H., Sunae Seo, Hyunjong Chung, Wong, H.-S Philip
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.11.2012
Institute of Electrical and Electronics Engineers
Subjects
Applied sciences
Current density
Design. Technologies. Operation analysis. Testing
Electric breakdown
Electronics
Exact sciences and technology
Graphene
Integrated circuit interconnections
Integrated circuits
interconnect
lifetime
Reliability
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Wires
Performance evaluation
High strength current
Electric stress
lifetime
Durability
Failures
interconnect
Transport process
wires
Graphene
Interconnection
Integrated circuit
Zero band gap semiconductors
Electrodiffusion
Oxidation
Copper
Reliability
Time constant
Current density
Computer aid
Defect formation
Damaging
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Summary:Understanding the breakdown current density is not enough for establishing the reliability performance of graphene interconnects. It is more important to know how graphene wires degrade with time under constant current stress and how that compares with conventional interconnects. This letter investigates the lifetime of graphene interconnect under constant high current stress. Under a stress current density of 20 MA/cm 2 at 250°C exposed to air, the mean time to fail of a 3-μm-wide 100-μm-long graphene interconnect is approximately 6 h, slightly worse than the extrapolated electromigration lifetime of a copper interconnect capped with CoWP at the same stress current density. Raman study shows that the interconnect failure is mainly caused by defect formation due to graphene oxidation. This suggests that optimizing the capping material for graphene interconnect will substantially improve the reliability lifetime of graphene interconnects.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2012.2211564