Automated detection and mapping of crystal tilt using thermal diffuse scattering in transmission electron microscopy

• Published in: Ultramicroscopy Vol. 267; p. 114050
• Main Authors: Cattaneo, Mauricio, Müller-Caspary, Knut, Barthel, Juri, MacArthur, Katherine E., Gauquelin, Nicolas, Lipinska-Chwalek, Marta, Verbeeck, Johan, Allen, Leslie J., Dunin-Borkowski, Rafal E.
• Format: Journal Article
• Language: English
• Published: Netherlands Elsevier B.V 01.12.2024
• Subjects: Kikuchi bands; Scanning transmission electron microscopy (STEM); Specimen bending; Thermal diffuse scattering; Tilt mapping; Thermal diffuse scattering; Specimen bending; Tilt mapping; Scanning transmission electron microscopy (STEM); Kikuchi bands
• ISSN: 0304-3991; 1879-2723; 1879-2723
• DOI: 10.1016/j.ultramic.2024.114050

Quantitative interpretation of transmission electron microscopy (TEM) data of crystalline specimens often requires the accurate knowledge of the local crystal orientation. A method is presented which exploits momentum-resolved scanning TEM (STEM) data to determine the local mistilt from a major zone axis. It is based on a geometric analysis of Kikuchi bands within a single diffraction pattern, yielding the center of the Laue circle. Whereas the approach is not limited to convergent illumination, it is here developed using unit-cell averaged diffraction patterns corresponding to high-resolution STEM settings. In simulation studies, an accuracy of approximately 0.1 mrad is found. The method is implemented in automated software and applied to crystallographic tilt and in-plane rotation mapping in two experimental cases. In particular, orientation maps of high-Mn steel and an epitaxially grown La0.7Sr0.3MnO3-SrTiO3 interface are presented. The results confirm the estimates of the simulation study and indicate that tilt mapping can be performed consistently over a wide field of view with diameters well above 100 nm at unit cell real space sampling. •Crystallographic tilt is automatically detected from Kikuchi bands in diffraction patterns.•The method is applied to simulated and experimental 4D-STEM data.•Investigation of specimen bending as well as tilt and rotation at crystal domain boundaries.