A Novel Active Gate Driver for Improving Switching Performance of High-Power SiC MOSFET Modules

• Published in: IEEE transactions on power electronics Vol. 34; no. 8; pp. 7775 - 7787
• Main Authors: Yang, Yuan, Wen, Yang, Gao, Yong
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.08.2019; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Active gate driver (AGD); Cost analysis; Delay time analysis; Electric potential; Electromagnetic interference; electromagnetic interference (EMI); Gate drivers; Logic gates; MOSFET; MOSFETs; Oscillations; Oscillators; overshoots; Power efficiency; Silicon carbide; silicon carbide (SiC) <sc xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">mosfet; Switches; Switching
• ISSN: 0885-8993; 1941-0107
• DOI: 10.1109/TPEL.2018.2878779

Featuring higher switching speed and lower losses, the silicon carbide mosfet s (SiC mosfet s) are widely used in higher power density and higher efficiency power electronic applications as a new solution. However, the increase of the switching speed induces oscillations, overshoots, electromagnetic interference (EMI), and even additional losses. In this paper, a novel active gate driver (AGD) for high-power SiC mosfet s is presented to fully utilize its potential of high-speed characteristic under different operation temperatures and load currents. The principle of the AGD is based on drive voltage decrement during the voltage and current slopes since high dV/dt and dI/dt are the source of the overshoots, oscillations, and EMI problems. In addition, the optimal drive voltage switching delay time has been analyzed and calculated considering a tradeoff between switching losses and switching stresses. Compared to conventional gate driver with fixed drive voltage, the proposed AGD has the capability of suppressing the overshoots, oscillations, and reducing losses without compromising the EMI. Finally, the switching performance of the AGD was experimentally verified on 1.2 kV/300 A and 1.7 kV/300 A SiC mosfet s in double pulse test under different operation temperatures and load currents. In addition, an EMI discussion and cost analysis were realized for AGD.