Electromagnetic Analysis of Integrated On-Chip Sensing Loop for Side-Channel and Fault-Injection Attack Detection

Securing crypto-cores is becoming increasingly difficult with the advent of electro-magnetic (EM) side-channel analysis (EMSCA) and fault injection attacks (FIAs). This letter presents an Ansys high-frequency structure simulator (HFSS)-based simulation framework for EM analysis of an integrated on-c...

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Bibliographic Details
Published inIEEE microwave and wireless components letters Vol. 32; no. 6; pp. 784 - 787
Main Authors Ghosh, Archisman, Nath, Mayukh, Das, Debayan, Ghosh, Santosh, Sen, Shreyas
Format Journal Article
LanguageEnglish
Published IEEE 01.06.2022
Subjects
Circuit faults
Electro-magnetic (EM) analysis-based framework
EM probe detection
fault injection detection
glitch attack detection
Logic gates
Metals
on-chip sensor
Probes
Switching circuits
System-on-chip
Voltage measurement
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Summary:Securing crypto-cores is becoming increasingly difficult with the advent of electro-magnetic (EM) side-channel analysis (EMSCA) and fault injection attacks (FIAs). This letter presents an Ansys high-frequency structure simulator (HFSS)-based simulation framework for EM analysis of an integrated on-chip sensor for detecting EMSCA and FIA and validates the efficacy of an on-chip higher metal layer loop-based zero area-overhead sensor using a custom-built 65-nm CMOS IC. A simple technique for incoming H-probe detection is also presented by measuring the absolute average of the induced voltage for every encryption.
ISSN:1531-1309
1558-1764
DOI:10.1109/LMWC.2022.3161001