Modeling Random Clock Jitter Effect of High-Speed Current-Steering NRZ and RZ DAC

In this paper, signal-to-noise ratio (SNR) degradation from random clock jitter in a current-steering digital-to-analog converter (CS-DAC) is analyzed based on a timing-to-amplitude error conversion method. A closed-form equation is derived to predict SNR for white noise clock jitter (WN-J) and low-...

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Bibliographic Details
Published inIEEE transactions on circuits and systems. I, Regular papers Vol. 65; no. 9; pp. 2832 - 2841
Main Authors Kim, Seonggeon, Lee, Kang-Yoon, Lee, Minjae
Format Journal Article
LanguageEnglish
Published New York IEEE 01.09.2018
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:In this paper, signal-to-noise ratio (SNR) degradation from random clock jitter in a current-steering digital-to-analog converter (CS-DAC) is analyzed based on a timing-to-amplitude error conversion method. A closed-form equation is derived to predict SNR for white noise clock jitter (WN-J) and low-pass filtered clock jitter (LPF-J) in non-return-to-zero (NRZ) and return-to-zero (RZ) DAC. Especially for the clock source with LPF-J, our equation predicts that the return-to-zero (RZ) DAC SNR is better than what the conventional analysis foresees due to the high-pass filter function derived in our analysis. Our analysis completely captures both WN-J and LPF-J in NRZ and RZ DAC, and is verified in both MATLAB simulation and measurement with the difference of less than 2 dB.
ISSN:1549-8328
1558-0806
DOI:10.1109/TCSI.2018.2821198