A Quasi-Analytical Model for Double-Gate Tunneling Field-Effect Transistors
Tunneling field-effect transistors (TFETs) are being widely investigated as a post-CMOS technology; however, despite significant experimental efforts, no quantitatively accurate device models are available. We derive an expression which provides the complete current characteristics of the double-gat...
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Published in | IEEE electron device letters Vol. 33; no. 10; pp. 1468 - 1470 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.10.2012
Institute of Electrical and Electronics Engineers |
Subjects | |
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Abstract | Tunneling field-effect transistors (TFETs) are being widely investigated as a post-CMOS technology; however, despite significant experimental efforts, no quantitatively accurate device models are available. We derive an expression which provides the complete current characteristics of the double-gate TFET and demonstrate its agreement with simulation. This model will be useful in the design and circuit analysis of TFETs. |
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AbstractList | Tunneling field-effect transistors (TFETs) are being widely investigated as a post-CMOS technology; however, despite significant experimental efforts, no quantitatively accurate device models are available. We derive an expression which provides the complete current characteristics of the double-gate TFET and demonstrate its agreement with simulation. This model will be useful in the design and circuit analysis of TFETs. |
Author | Pan, A. Chi On Chui |
Author_xml | – sequence: 1 givenname: A. surname: Pan fullname: Pan, A. email: pandrew@ucla.edu organization: Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA – sequence: 2 surname: Chi On Chui fullname: Chi On Chui organization: Dept. of Electr. Eng., Univ. of California, Los Angeles, CA, USA |
BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=26443155$$DView record in Pascal Francis |
BookMark | eNo9kM1LAzEQxYNUsK3eBS-5eEzN12Y3x9IvxYoI9byk2YlEYrZsdg_9701p6WkY5r2ZN78JGsU2AkKPjM4Yo_plu1rOOGV8xjmttBA3aMyKoiK0UGKExrSUjAhG1R2apPRLKZOylGP0Psdfg0mezKMJx95bE_BH20DAru3wsh32AcjG9IB3Q4wQfPzBaw-hISvnwPZ415mYfOrbLt2jW2dCgodLnaLv9Wq3eCXbz83bYr4llmvRE9ZAQcuqyOmAayeFpa4Erow1Dc-ZZekEA90oC8AsaKagyi3fGytpA0ZMET3vtV2bUgeuPnT-z3THmtH6BKPOMOoTjPoCI1uez5aDSflFl0Nbn64-rqQU-XTWPZ11HgCuY8UrpSsl_gGDXWmm |
CODEN | EDLEDZ |
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Cites_doi | 10.1109/JPROC.2010.2070470 10.1038/nature10679 10.1109/55.863106 10.1109/DRC.2010.5551905 10.1109/DRC.2011.5994495 10.1063/1.1735965 10.1109/LED.2008.2005517 10.1109/IEDM.2011.6131493 10.1109/16.249482 10.1063/1.3609064 10.1109/TED.2010.2040661 |
ContentType | Journal Article |
Copyright | 2015 INIST-CNRS |
Copyright_xml | – notice: 2015 INIST-CNRS |
DBID | 97E RIA RIE IQODW AAYXX CITATION |
DOI | 10.1109/LED.2012.2208933 |
DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library Online Pascal-Francis CrossRef |
DatabaseTitle | CrossRef |
DatabaseTitleList | |
Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library Online url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/ sourceTypes: Publisher |
DeliveryMethod | fulltext_linktorsrc |
Discipline | Engineering Applied Sciences |
EISSN | 1558-0563 |
EndPage | 1470 |
ExternalDocumentID | 10_1109_LED_2012_2208933 26443155 6286986 |
Genre | orig-research |
GroupedDBID | -~X .DC 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AASAJ ABQJQ ABVLG ACGFO ACIWK ACNCT AENEX AETIX AFFNX AI. AIBXA AKJIK ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD HZ~ IBMZZ ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RIG RNS TAE TN5 TWZ VH1 XFK 08R ABFLS IPNFZ IQODW AAYXX CITATION |
ID | FETCH-LOGICAL-c293t-1de50785558e29f43c0f7e26acad215547f31e9d6cee1ce916e8e9d2bac40dea3 |
IEDL.DBID | RIE |
ISSN | 0741-3106 |
IngestDate | Fri Aug 23 01:29:49 EDT 2024 Tue Sep 20 18:57:29 EDT 2022 Wed Jun 26 19:20:19 EDT 2024 |
IsPeerReviewed | true |
IsScholarly | true |
Issue | 10 |
Keywords | Field effect transistor tunnel field-effect transistor (TFET) Complementary MOS technology Network analysis Tunnel effect Analytical method tunneling Double gate (DG) Dual gate field effect transistor Tunnel transistors |
Language | English |
License | CC BY 4.0 |
LinkModel | DirectLink |
MergedId | FETCHMERGED-LOGICAL-c293t-1de50785558e29f43c0f7e26acad215547f31e9d6cee1ce916e8e9d2bac40dea3 |
PageCount | 3 |
ParticipantIDs | crossref_primary_10_1109_LED_2012_2208933 pascalfrancis_primary_26443155 ieee_primary_6286986 |
PublicationCentury | 2000 |
PublicationDate | 2012-10-01 |
PublicationDateYYYYMMDD | 2012-10-01 |
PublicationDate_xml | – month: 10 year: 2012 text: 2012-10-01 day: 01 |
PublicationDecade | 2010 |
PublicationPlace | New York, NY |
PublicationPlace_xml | – name: New York, NY |
PublicationTitle | IEEE electron device letters |
PublicationTitleAbbrev | LED |
PublicationYear | 2012 |
Publisher | IEEE Institute of Electrical and Electronics Engineers |
Publisher_xml | – name: IEEE – name: Institute of Electrical and Electronics Engineers |
References | ref8 ref12 ref7 lu (ref4) 2010 (ref11) 2011 ref9 ref3 ref6 ref10 ref5 ref2 ref1 |
References_xml | – ident: ref1 doi: 10.1109/JPROC.2010.2070470 – ident: ref2 doi: 10.1038/nature10679 – ident: ref12 doi: 10.1109/55.863106 – start-page: 17 year: 2010 ident: ref4 article-title: Geometry dependent tunnel FET performance-Dilemma of electrostatics vs. quantum confinement publication-title: Proc 68th Device Res Conf doi: 10.1109/DRC.2010.5551905 contributor: fullname: lu – ident: ref6 doi: 10.1109/DRC.2011.5994495 – ident: ref10 doi: 10.1063/1.1735965 – ident: ref9 doi: 10.1109/LED.2008.2005517 – year: 2011 ident: ref11 publication-title: Sentaurus Device User Guide – ident: ref7 doi: 10.1109/IEDM.2011.6131493 – ident: ref8 doi: 10.1109/16.249482 – ident: ref5 doi: 10.1063/1.3609064 – ident: ref3 doi: 10.1109/TED.2010.2040661 |
SSID | ssj0014474 |
Score | 2.3734117 |
Snippet | Tunneling field-effect transistors (TFETs) are being widely investigated as a post-CMOS technology; however, despite significant experimental efforts, no... |
SourceID | crossref pascalfrancis ieee |
SourceType | Aggregation Database Index Database Publisher |
StartPage | 1468 |
SubjectTerms | Analytical models Applied sciences Design. Technologies. Operation analysis. Testing Doping Double gate (DG) Electric potential Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Integrated circuits Logic gates Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Semiconductor process modeling Theoretical study. Circuits analysis and design Transistors tunnel field-effect transistor (TFET) Tunneling |
Title | A Quasi-Analytical Model for Double-Gate Tunneling Field-Effect Transistors |
URI | https://ieeexplore.ieee.org/document/6286986 |
Volume | 33 |
hasFullText | 1 |
inHoldings | 1 |
isFullTextHit | |
isPrint | |
link | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB5qT3rwLdZH2YMXwdRks02yx6KWolYQFLyF7GYCorRik4u_3plNGqp48BIS8mCZWTLf7nzzDcBZkanC-rrwuH01HTD2TJRwulAFGMS0JjJcKDx9iCbP6vZl-NKBi7YWBhEd-QwHfOpy-fncVrxVdslllDqJ1mAt1rqu1WozBkrVissUIem_4rcpSV9f3t9cM4dLDqT0ubv8jxDkeqowIzJbkFGKupvFSogZb8F0ObiaWfI2qEozsF-_dBv_O_pt2GywphjVk2MHOjjbhY0VBcI9uBuJxypbvHpOnMTtawtuj_YuCMwKQtfmHT3eYRNPFTNi6CUxZtKbV8seCxfrnNTIYh-exzdPVxOv6a_gWQrypRfkSGgwYcUvlLpQofWLGGWU2SyXjDPiIgxQ5xEF0sAiAUlM6FKazCo_xyw8gO5sPsNDEE7zJZSJydCoSFk9NDIswpgWQ0NM_LAH50uTpx-1jEbqlh--Tsk9KbsnbdzTgz02XvtcY7ce9H_4qL3PkC6k4R79_d4xrPPXawLeCXTLzwpPCUiUpu9m0DfHQ8Qk |
link.rule.ids | 315,783,787,799,27936,27937,55086 |
linkProvider | IEEE |
linkToHtml | http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1LS8NAEB6qHtSDryrW5x68CKYmm20ex6KWaltBqOAtZDcTEEsVm1z89c5s2lDFg5eQkIQsM0vm251vvgG4yFOVGzfOHW5fTQcMHR1EnC5UHnohrYk0FwqPHoP-s3p46bw04KquhUFESz7DNp_aXH72bkreKrvmMso4ClZgjXB1FFTVWnXOQKlKc5liJP1Z3Dop6cbXw7tbZnHJtpQu95f_EYRsVxXmRKYzMkte9bNYCjK9bRgthldxS97aZaHb5uuXcuN_x78DW3O0KbrV9NiFBk73YHNJg7AJg654KtPZq2PlSezOtuAGaRNBcFYQvtYTdHiPTYxL5sTQS6LHtDenEj4WNtpZsZHZPjz37sY3fWfeYcExFOYLx8uQ8GDEml8o41z5xs1DlEFq0kwy0ghz38M4CyiUegYJSmJEl1KnRrkZpv4BrE7fp3gIwqq--DLSKWoVKBN3tPRzP6TlUAcj12_B5cLkyUclpJHYBYgbJ-SehN2TzN3TgiYbr35ubrcWnP3wUX2fQZ1Pwz36-71zWO-PR8NkeP84OIYN_lJFxzuB1eKzxFOCFYU-s7PpGzXLx28 |
openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+Quasi-Analytical+Model+for+Double-Gate+Tunneling+Field-Effect+Transistors&rft.jtitle=IEEE+electron+device+letters&rft.au=Pan%2C+A.&rft.au=Chi+On+Chui&rft.date=2012-10-01&rft.pub=IEEE&rft.issn=0741-3106&rft.eissn=1558-0563&rft.volume=33&rft.issue=10&rft.spage=1468&rft.epage=1470&rft_id=info:doi/10.1109%2FLED.2012.2208933&rft.externalDocID=6286986 |
thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0741-3106&client=summon |
thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0741-3106&client=summon |
thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0741-3106&client=summon |