In-situ characterization of thin polymer films for applications in chemical sensing of volatile organic compounds by spectroscopic ellipsometry
Polymer coatings are applied in many kinds of chemical sensors. The interaction with organic vapours changes the physical properties of the coating material. For optical sensors, changes in the coating volume and the complex refractive index are most important. Spectroscopic ellipsometry has been ap...
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| Published in | Analytical and bioanalytical chemistry Vol. 357; no. 3; pp. 292 - 296 |
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| Main Authors | , , |
| Format | Journal Article Conference Proceeding |
| Language | English |
| Published |
Berlin
Springer
01.02.1997
Springer Nature B.V |
| Subjects | |
| Online Access | Get full text |
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| Abstract | Polymer coatings are applied in many kinds of chemical sensors. The interaction with organic vapours changes the physical properties of the coating material. For optical sensors, changes in the coating volume and the complex refractive index are most important. Spectroscopic ellipsometry has been applied for the first time to the in-situ characterization of thin poly(dimethylsiloxane) films in contact with tetrachloroethene, toluene and cyclohexane vapours. The differences in bulk refractive index between organic solvent and polymer are large for toluene and tetrachloroethene and both effects were studied separately. Cyclohexane has a bulk refractive index very close to the investigated poly(dimethylsiloxane) films. Therefore the calculation of the volume fraction of the analyte in the mixture phase with the polymer is subject to large errors for vapour concentrations below 5000 ppm. |
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| AbstractList | Polymer coatings are applied in many kinds of chemical sensors. The interaction with organic vapours changes the physical properties of the coating material. For optical sensors, changes in the coating volume and the complex refractive index are most important. Spectroscopic ellipsometry has been applied for the first time to the in-situ characterization of thin poly(dimethylsiloxane) films in contact with tetrachloroethene, toluene and cyclohexane vapours. The differences in bulk refractive index between organic solvent and polymer are large for toluene and tetrachloroethene and both effects were studied separately. Cyclohexane has a bulk refractive index very close to the investigated poly(dimethylsiloxane) films. Therefore the calculation of the volume fraction of the analyte in the mixture phase with the polymer is subject to large errors for vapour concentrations below 5000 ppm. |
| Author | Spaeth, Karin Kraus, Gerolf Gauglitz, Günter |
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| Cites_doi | 10.1021/ac00063a021 10.1007/BF00326607 10.1366/0003702934066956 10.1016/0040-6090(93)90109-3 10.1016/0925-4005(94)01572-4 10.1002/andp.19354160705 10.1016/0003-2670(95)00213-J |
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| DOI | 10.1007/s002160050155 |
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| Keywords | Chemical sensors Refractive index Toluene Coatings Ellipsometry Ethylene(tetrachloro) Characterization Volatile organic compounds Thin films Thickness Cyclohexane Polymers Silicones |
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| References | RA McGill (73570292216_CR5) 1994; 24 G Kraus (73570292216_CR7) 1995; 352 SJ Patrash (73570292216_CR2) 1993; 65 RMA Azzam (73570292216_CR8) 1988 DAG Bruggemann (73570292216_CR10) 1935; 5 73570292216_CR13 73570292216_CR11 JP Conzen (73570292216_CR3) 1993; 47 L Bergmann (73570292216_CR9) 1993 A Hierlemann (73570292216_CR1) 1995; 26 G Kraus (73570292216_CR4) 1994; 349 S Pittal (73570292216_CR12) 1993; 233 HM Yan (73570292216_CR6) 1995; 312 |
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| SubjectTerms | Analytical chemistry Chemical perception Chemical sensors Chemistry Chemoreception Coatings Cyclohexane Exact sciences and technology General, instrumentation Optical measuring instruments Optical properties Organic compounds Physical properties Polydimethylsiloxane Polymer coatings Polymer films Polymers Refractivity Sensors Spectroellipsometry Spectroscopy Tetrachloroethylene Thin films Toluene VOCs Volatile organic compounds |
| Title | In-situ characterization of thin polymer films for applications in chemical sensing of volatile organic compounds by spectroscopic ellipsometry |
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