In-situ characterization of thin polymer films for applications in chemical sensing of volatile organic compounds by spectroscopic ellipsometry

Polymer coatings are applied in many kinds of chemical sensors. The interaction with organic vapours changes the physical properties of the coating material. For optical sensors, changes in the coating volume and the complex refractive index are most important. Spectroscopic ellipsometry has been ap...

Full description

Saved in:
Bibliographic Details
Published inAnalytical and bioanalytical chemistry Vol. 357; no. 3; pp. 292 - 296
Main Authors Spaeth, Karin, Kraus, Gerolf, Gauglitz, Günter
Format Journal Article Conference Proceeding
LanguageEnglish
Published Berlin Springer 01.02.1997
Springer Nature B.V
Subjects
Analytical chemistry
Chemical perception
Chemical sensors
Chemistry
Chemoreception
Coatings
Cyclohexane
Exact sciences and technology
General, instrumentation
Optical measuring instruments
Optical properties
Organic compounds
Physical properties
Polydimethylsiloxane
Polymer coatings
Polymer films
Polymers
Refractivity
Sensors
Spectroellipsometry
Spectroscopy
Tetrachloroethylene
Thin films
Toluene
VOCs
Volatile organic compounds
Chemical sensors
Refractive index
Toluene
Coatings
Ellipsometry
Ethylene(tetrachloro)
Characterization
Volatile organic compounds
Thin films
Thickness
Cyclohexane
Polymers
Silicones
Online AccessGet full text

Cover

More Information
Summary:Polymer coatings are applied in many kinds of chemical sensors. The interaction with organic vapours changes the physical properties of the coating material. For optical sensors, changes in the coating volume and the complex refractive index are most important. Spectroscopic ellipsometry has been applied for the first time to the in-situ characterization of thin poly(dimethylsiloxane) films in contact with tetrachloroethene, toluene and cyclohexane vapours. The differences in bulk refractive index between organic solvent and polymer are large for toluene and tetrachloroethene and both effects were studied separately. Cyclohexane has a bulk refractive index very close to the investigated poly(dimethylsiloxane) films. Therefore the calculation of the volume fraction of the analyte in the mixture phase with the polymer is subject to large errors for vapour concentrations below 5000 ppm.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0937-0633
1618-2642
1432-1130
1618-2650
DOI:10.1007/s002160050155