Characteristics of a field-effect transistor fabricated with electropolymerized thin film

The preparation and characteristics of the solid-state field-effect transistor (FET) based on poly(p,p'-biphenol)(PBP) thin film prepared by electropolymerization of p,p'-biphenol are presented. The PBP-based FET displayed excellent drain current ( I D )-drain voltage ( V D ) characteristi...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 27; no. 3; pp. L448 - L450
Main Authors OYAMA, N, YOSHIMURA, F, OHSAKA, T, KOEZUKA, H, ANDO, T
Format Journal Article
LanguageEnglish
Published Tokyo Japanese journal of applied physics 01.03.1988
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Summary:The preparation and characteristics of the solid-state field-effect transistor (FET) based on poly(p,p'-biphenol)(PBP) thin film prepared by electropolymerization of p,p'-biphenol are presented. The PBP-based FET displayed excellent drain current ( I D )-drain voltage ( V D ) characteristics for various gate voltages. The I D - V D characteristics were analyzed as in a conventional MOS transistor.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.27.L448