Bendable Microwave AlGaN/GaN High-Electron-Mobility Transistor With Output Power Density of 2.65 W/mm
Flexible radio frequency (RF) devices are in high demand for wearable electronics; however, they currently do not offer sufficient output power for application in fifth-generation wireless communication systems. This paper reports a bendable gallium nitride (GaN) high-electron-mobility-transistor (H...
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Published in | IEEE electron device letters Vol. 42; no. 5; pp. 677 - 680 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
New York
IEEE
01.05.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | Flexible radio frequency (RF) devices are in high demand for wearable electronics; however, they currently do not offer sufficient output power for application in fifth-generation wireless communication systems. This paper reports a bendable gallium nitride (GaN) high-electron-mobility-transistor (HEMT) with state-of-the-art output power in the microwave band. In this study, a fabrication method is proposed, where HEMT is originally grown on silicon carbide (SiC) substrates. After thinning the SiC substrates down to <inline-formula> <tex-math notation="LaTeX">5~\mu \text{m} </tex-math></inline-formula>, HEMT is transferred using a copper film rather than flexible substrates used in other studies. The measurements indicated that the fabricated devices exhibited a saturation output power of 2.65 W, corresponding to a power density of 2.65 W/mm, which was associated with maximum power added efficiency (PAE) of 51% at 3 GHz. The performance of the fabricated device remained stable even with a bending radius of up to 0.6 cm. These results indicated that the proposed fabrication method can potentially be used to realize high-power flexible RF electronics. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2021.3068738 |