Soft-error resilience of the IBM POWER6 processor input/output subsystem

The soft-error resilience of the IBM POWER6(TM) processor I/O (input/output) subsystem was measured using proton beam irradiation to accelerate the effect of single-event upsets. Test programs exercised each of the adapters on the chip. Error rates were measured for various cases ranging from idle t...

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Bibliographic Details
Published inIBM journal of research and development Vol. 52; no. 3; pp. 285 - 292
Main Authors Bender, C, Sanda, P N, Kudva, P, Mata, R, Pokala, V, Haraden, R, Schallhorn, M
Format Journal Article
LanguageEnglish
Published Armonk International Business Machines Corporation 01.05.2008
Subjects
Error analysis
Integrated circuits
Microprocessors
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Summary:The soft-error resilience of the IBM POWER6(TM) processor I/O (input/output) subsystem was measured using proton beam irradiation to accelerate the effect of single-event upsets. Test programs exercised each of the adapters on the chip. Error rates were measured for various cases ranging from idle to high I/O bandwidth and utilization. The POWER6 processor and I/O hub subsystem work together to maintain resiliency even under strenuous irradiation conditions. [PUBLICATION ABSTRACT]
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
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ISSN:0018-8646
0018-8646
2151-8556
DOI:10.1147/rd.523.0285