Semiconductor Laser-Based Multi-Channel Wideband Chaos Generation Using Optoelectronic Hybrid Feedback and Parallel Filtering

We propose and experimentally demonstrate a novel multi-channel chaos generation scheme, which can simultaneously produce multiple chaotic signals with wideband spectrum and suppressed time-delay signature (TDS). In this scheme, we introduce an external self-phase-modulated feedback (ESPMF) to impro...

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Bibliographic Details
Published inJournal of lightwave technology Vol. 40; no. 3; pp. 751 - 761
Main Authors Zhao, Anke, Jiang, Ning, Zhang, Yiqun, Peng, Jiafa, Liu, Shiqin, Qiu, Kun, Deng, Mingliang, Zhang, Qianwu
Format Journal Article
LanguageEnglish
Published New York IEEE 01.02.2022
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:We propose and experimentally demonstrate a novel multi-channel chaos generation scheme, which can simultaneously produce multiple chaotic signals with wideband spectrum and suppressed time-delay signature (TDS). In this scheme, we introduce an external self-phase-modulated feedback (ESPMF) to improve the optical bandwidth of the initial chaos generated by a conventional external-cavity semiconductor laser (ECSL), then optical tunable filters (OTFs) are utilized to simultaneously extract three-channel chaotic outputs. The experimental results show that the proposed scheme has three main advantages. Firstly, it can simultaneously generate multiple chaotic outputs with different central wavelengths and low correlations. Secondly, the bandwidth of original ECSL-based chaos can be improved by several times, and the undesired TDS characteristics in the original chaos can be completely suppressed to an indistinguishable level (lower than 0.02). Thirdly, the bandwidths of these chaotic outputs are flexible and can be adjusted within a wide range of 20 GHz by controlling the filter bandwidths. In addition, we demonstrate an application of the proposed chaos generation scheme in random bit generation (RBG), and multi-channel high-speed random bit sequences with a total generation rate over Tb/s and NIST verified randomness are simultaneously obtained.
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ISSN:0733-8724
1558-2213
DOI:10.1109/JLT.2021.3123653