Time-Domain Characterization of Photonic Integrated Filters Subject to Fabrication Variations

Fabrication variations are a key factor to degrade the performance of photonic integrated circuits (PICs), and especially wavelength filters. We propose an efficient modeling approach to quantify the effects of fabrication variations on the time-domain performance of linear passive photonic integrat...

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Published inJournal of lightwave technology Vol. 37; no. 21; pp. 5561 - 5570
Main Authors Ye, Yinghao, Wang, Mi, Spina, Domenico, Bogaerts, Wim, Dhaene, Tom
Format Journal Article
LanguageEnglish
Published New York IEEE 01.11.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Baseband
Circuit design
Computational modeling
Computer simulation
Fabrication variations
Integrated circuit modeling
Integrated circuits
Modelling
Performance degradation
photonic integrated circuits
Photonics
polynomial Chaos
Polynomials
Random variables
Stochastic processes
Time domain analysis
time-domain variability analysis
Wave filters
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Abstract Fabrication variations are a key factor to degrade the performance of photonic integrated circuits (PICs), and especially wavelength filters. We propose an efficient modeling approach to quantify the effects of fabrication variations on the time-domain performance of linear passive photonic integrated circuits (including the wavelength filters) in the design stage, before fabrication. In particular, this novel approach conjugates the accuracy of the Polynomial Chaos (PC) expansion in describing stochastic variations and the efficiency of a Vector Fitting (VF)-based baseband modeling technique in performing time-domain simulations. A suitable example validates the performance of the proposed method.
AbstractList Fabrication variations are a key factor to degrade the performance of photonic integrated circuits (PICs), and especially wavelength filters. We propose an efficient modeling approach to quantify the effects of fabrication variations on the time-domain performance of linear passive photonic integrated circuits (including the wavelength filters) in the design stage, before fabrication. In particular, this novel approach conjugates the accuracy of the Polynomial Chaos (PC) expansion in describing stochastic variations and the efficiency of a Vector Fitting (VF)-based baseband modeling technique in performing time-domain simulations. A suitable example validates the performance of the proposed method.
Author Dhaene, Tom
Wang, Mi
Bogaerts, Wim
Ye, Yinghao
Spina, Domenico
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Cites_doi 10.1016/j.jcp.2014.02.024
10.1109/LMWC.2015.2440779
10.1109/JLT.2013.2294345
10.1364/OE.26.005894
10.1364/OE.25.029778
10.3390/electronics7030030
10.1109/JLT.2019.2893545
10.1109/TMTT.2015.2417855
10.1109/JSTQE.2019.2918949
10.1109/TCAD.2013.2263039
10.1109/TMTT.2008.2007319
10.1364/PRJ.6.000560
10.1109/TPWRD.2008.919027
10.1109/TMTT.2009.2013309
10.1109/JSTQE.2019.2906271
10.1515/nanoph-2016-0110
10.1002/jnm.2037
10.1002/lpor.201700237
10.1002/nme.1294
10.1007/978-3-642-10503-6_4
10.1109/JLT.2017.2714862
10.1364/OE.23.004242
10.1109/JLT.2013.2273391
10.1109/61.772353
10.1016/j.jcp.2010.12.021
10.1364/OE.23.027180
10.1109/JLT.2019.2892512
10.1109/TMTT.2016.2642104
10.2514/6.2009-2274
10.1109/TEMC.2017.2727341
10.1364/PRJ.4.000093
10.1109/TCPMT.2013.2259295
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References ref35
ref13
ref34
ref12
sou (ref29) 2005; 63
ref15
ref31
ref30
ref33
ref11
ref10
ref2
ref1
ref17
ref16
ref19
ref18
(ref32) 2009
cui (ref14) 2018
ref24
ref23
ref26
ref25
ref20
ref22
ref21
ref28
ref27
ref8
ref7
ref9
ref3
ref6
ref5
fishman (ref4) 2013
References_xml – ident: ref31
  doi: 10.1016/j.jcp.2014.02.024
– ident: ref8
  doi: 10.1109/LMWC.2015.2440779
– ident: ref33
  doi: 10.1109/JLT.2013.2294345
– year: 2009
  ident: ref32
– ident: ref15
  doi: 10.1364/OE.26.005894
– ident: ref34
  doi: 10.1364/OE.25.029778
– ident: ref27
  doi: 10.3390/electronics7030030
– ident: ref19
  doi: 10.1109/JLT.2019.2893545
– ident: ref7
  doi: 10.1109/TMTT.2015.2417855
– ident: ref3
  doi: 10.1109/JSTQE.2019.2918949
– ident: ref5
  doi: 10.1109/TCAD.2013.2263039
– ident: ref22
  doi: 10.1109/TMTT.2008.2007319
– ident: ref18
  doi: 10.1364/PRJ.6.000560
– ident: ref23
  doi: 10.1109/TPWRD.2008.919027
– ident: ref24
  doi: 10.1109/TMTT.2009.2013309
– ident: ref16
  doi: 10.1109/JSTQE.2019.2906271
– ident: ref13
  doi: 10.1515/nanoph-2016-0110
– ident: ref28
  doi: 10.1002/jnm.2037
– ident: ref2
  doi: 10.1002/lpor.201700237
– volume: 63
  start-page: 681
  year: 2005
  ident: ref29
  article-title: Fast time-domain simulation for large-order linear time-invariant state space systems
  publication-title: Int J Numer Method Eng
  doi: 10.1002/nme.1294
– ident: ref17
  doi: 10.1007/978-3-642-10503-6_4
– ident: ref1
  doi: 10.1109/JLT.2017.2714862
– ident: ref11
  doi: 10.1364/OE.23.004242
– ident: ref20
  doi: 10.1109/JLT.2013.2273391
– ident: ref21
  doi: 10.1109/61.772353
– ident: ref30
  doi: 10.1016/j.jcp.2010.12.021
– ident: ref25
  doi: 10.1364/OE.23.027180
– ident: ref35
  doi: 10.1109/JLT.2019.2892512
– start-page: 1
  year: 2018
  ident: ref14
  article-title: Uncertainty quantification of electronic and photonic ICs with non-Gaussian correlated process variations
  publication-title: Proc IEEE/ACM Int Conf Comput -Aided Des
– ident: ref9
  doi: 10.1109/TMTT.2016.2642104
– ident: ref26
  doi: 10.2514/6.2009-2274
– ident: ref10
  doi: 10.1109/TEMC.2017.2727341
– ident: ref12
  doi: 10.1364/PRJ.4.000093
– year: 2013
  ident: ref4
  publication-title: Monte Carlo Concepts Algorithms and Applications
– ident: ref6
  doi: 10.1109/TCPMT.2013.2259295
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Snippet Fabrication variations are a key factor to degrade the performance of photonic integrated circuits (PICs), and especially wavelength filters. We propose an...
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SubjectTerms Baseband
Circuit design
Computational modeling
Computer simulation
Fabrication variations
Integrated circuit modeling
Integrated circuits
Modelling
Performance degradation
photonic integrated circuits
Photonics
polynomial Chaos
Polynomials
Random variables
Stochastic processes
Time domain analysis
time-domain variability analysis
Wave filters
Title Time-Domain Characterization of Photonic Integrated Filters Subject to Fabrication Variations
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Volume 37
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