Preparation and characterization of spinel SrFe2O4 nanoparticles by method sol-gel
In this paper, spinel-strontium ferrite nanoparticles (SrFe 2 O 4 ) were prepared by the sol-gel method. Structural, dielectric, and optical properties were characterized by the X-ray diffraction (XRD), LCR, UV-visible spectrophotometry, and photoluminescence spectroscopy (PL). The X-ray diffraction...
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Published in | Journal of the Australian Ceramic Society Vol. 57; no. 5; pp. 1359 - 1369 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Singapore
Springer Singapore
01.12.2021
|
Subjects | |
Online Access | Get full text |
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Summary: | In this paper, spinel-strontium ferrite nanoparticles (SrFe
2
O
4
) were prepared by the sol-gel method. Structural, dielectric, and optical properties were characterized by the X-ray diffraction (XRD), LCR, UV-visible spectrophotometry, and photoluminescence spectroscopy (PL). The X-ray diffraction pattern shows that the single-phase cubic spinel structure for a sample at temperature of 700 °C has been formed. Also, studies of the field-scattering scanning electron microscope show that morphology synthesized samples are homogeneous, but since the samples have a magnetic property, thus the samples are aggregated. The dielectric parameters such as the dielectric constant (έ), dielectric loss (ἕ), and the ac electrical conductivity (σ
ac
) of the samples were investigated by using LCR-meter at room temperature in the frequency range of 20 Hz to 10 MHz. The results of the dielectric parameters show that by decreasing the frequency, the dielectric constant and the dielectric loss are increased, while the ac electrical conductivity increases in which these changes are justified by the Maxwell-Wegener model. The results of ultraviolet-light spectroscopy show that, by increasing temperature, the energy gap of SrFe
2
O
4
nanoparticles decreases. Also, the results of photoluminescence spectroscopy of SrFe
2
O
4
nanoparticles show that there is an emission peak in the ultraviolet region that is due to the recombination of free excitements arising from an exciton-exciton process which is known as the near band edge (NBE). |
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ISSN: | 2510-1560 2510-1579 |
DOI: | 10.1007/s41779-021-00633-x |