Wearout estimation using the Robustness Validation methodology for components in 150 °C ambient automotive applications

• Published in: Microelectronics and reliability Vol. 50; no. 9; pp. 1744 - 1749
• Main Authors: Lecuyer, P., Fremont, H., Landesman, J-P., Bahi, M-A.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Kidlington Elsevier Ltd 2010; Elsevier
• Subjects: Applied sciences; Electronics; Engineering Sciences; Exact sciences and technology; Micro and nanotechnologies; Microelectronics; Testing, measurement, noise and reliability; Semiconductor device; Semiconductor device reliability; Wear; Automobile industry; Robustness; Failures; Gain; Room temperature; Damaging
• ISSN: 0026-2714; 1872-941X
• DOI: 10.1016/j.microrel.2010.07.076

AEC-Q100 is the usual qualification reference for automotive ICs dedicated to applications up to 125 °C ambient temperature. Although qualification criteria have been defined which enable the qualification extension up to 150 °C, this might always not satisfy the requirements of automotive Zero Defect policy. The mission profile might for instance exceed the scope of AEC-Q100 verifications, or it might be impossible to predict when the wearout period will start depending on use, having gained very little knowledge of the degradation kinetics. This study provides a concrete analysis of potential customer exposure to wearout failure mechanisms based on the principles developed in SAE J1879 [1], Handbook for Robustness Validation of Semiconductor Devices in Automotive Application.