Noisy Non-Adaptive Group Testing: A (Near-)Definite Defectives Approach

• Published in: IEEE transactions on information theory Vol. 66; no. 6; pp. 3775 - 3797
• Main Authors: Scarlett, Jonathan, Johnson, Oliver
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.06.2020; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Algorithms; Analytical models; Channel noise; Error probability; Group testing; information-theoretic limits; Lower bounds; Matching pursuit algorithms; Noise; Noise level; Noise measurement; Pattern matching; performance bounds; sparsity; Testing; Z channel

The group testing problem consists of determining a small set of defective items from a larger set of items based on a number of possibly-noisy tests, and is relevant in applications such as medical testing, communication protocols, pattern matching, and more. We study the noisy version of this prob...