Depth profiling of multi-layer samples using femtosecond laser ablation

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Bibliographic Details
Published inJournal of analytical atomic spectrometry Vol. 16; no. 6; pp. 616 - 621
Main Authors Margetic, V., Bolshov, M., Stockhaus, A., Niemax, K., Hergenröder, R.
Format Journal Article
LanguageEnglish
Published 2001
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ISSN:0267-9477
1364-5544
DOI:10.1039/B100016K