Structural and dielectric properties of phosphorous-doped PLZT ceramics

In the present work we have reported the unique effects of P2O5-doped PLZT ceramics with composition (Pb0.92La0.08)(Zr0.65Ti0.35)O3 +x wt% of P2O5 (wherex = 1, 3 and 5) prepared chemically by co-precipitation method. X-ray diffraction studies suggest that the prepared compound was very fine (10–25 n...

Full description

Saved in:
Bibliographic Details
Published inPramāṇa Vol. 65; no. 6; pp. 1127 - 1132
Main Authors Goel, Puja, Sharma, Subhash, Yadav, Kanhaiya Lal, James, Ajit Ram
Format Journal Article
LanguageEnglish
Published Dordrecht Springer Nature B.V 01.12.2005
Subjects
Bulk density
Ceramics
Curie temperature
Dielectric loss
Dielectric properties
Permittivity
Phase transitions
Phosphorus pentoxide
Online AccessGet full text

Cover

More Information
Summary:In the present work we have reported the unique effects of P2O5-doped PLZT ceramics with composition (Pb0.92La0.08)(Zr0.65Ti0.35)O3 +x wt% of P2O5 (wherex = 1, 3 and 5) prepared chemically by co-precipitation method. X-ray diffraction studies suggest that the prepared compound was very fine (10–25 nm), homogeneous and of rhombohedral symmetry. The apparent density of samples decreased with the P5+ additions. Studies of dielectric constant and dielectric loss as a function of frequency (10–1000 kHz) and temperature suggest that the compound undergoes diffuse type of phase transition without any sign of relaxor behaviour. With increasingx, dielectric constant was found to decrease appreciably, whereas Curie temperature (TC) was found to increase
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0304-4289
0973-7111
DOI:10.1007/BF02705288