Interferometric configuration based on a grating interferometer for the measurement of the phase between TE and TM polarizations after diffraction by gratings
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Published in | Optics letters Vol. 20; no. 21; p. 2255 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
United States
01.11.1995
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Online Access | Get more information |
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ISSN: | 0146-9592 |
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DOI: | 10.1364/OL.20.002255 |