Interferometric configuration based on a grating interferometer for the measurement of the phase between TE and TM polarizations after diffraction by gratings

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Bibliographic Details
Published inOptics letters Vol. 20; no. 21; p. 2255
Main Authors Giovannini, H, Akhouayri, H
Format Journal Article
LanguageEnglish
Published United States 01.11.1995
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ISSN:0146-9592
DOI:10.1364/OL.20.002255