Comparison of the exposure characteristics of soft-x-ray film SIOFM-5FW with Kodak 101-05 and Ilford Q-plates

• Published in: Applied optics (2004) Vol. 36; no. 13; p. 2843
• Main Authors: Fan, P Z, Zhou, J Z, Li, Y L
• Format: Journal Article
• Language: English
• Published: United States 01.05.1997
• ISSN: 1559-128X
• DOI: 10.1364/AO.36.002843

In identical exposure and processing conditions, we compare the exposure characteristics of soft-x-ray film, SIOFM-5FW, with Kodak101-05 and Ilford Q-plates in the soft-x-ray and extreme UV region below 100 nm, using D-19 and Phenisol developers. The experimental results show that for radiation greater than 10 nm, the response of SIOFM-5FW lies between the Kodak101-05 and the Ilford Q-plates but is closer to the former. For radiation of less than 10 nm, the SIOFM-5FW is more sensitive than the Kodak101-05 plate, with a higher saturated optical density, a higher dynamic range, and an obvious carbon K absorption edge structure in the spectra obtained. The effects of the two developers used on the exposure characteristics are discussed.