Determination of surface-layer parameters on pure liquids via ellipsometry

In this work we describe a method for evaluating such parameters of an interfacial layer as the refractive index and thickness of the liquid–vapor interface, based on the measured ellipticity coefficient, ρ, at different wavelengths of the probing light and the data [1] for several pure fluids. In p...

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Bibliographic Details
Published inMoscow University physics bulletin Vol. 71; no. 2; pp. 208 - 214
Main Authors Il’ina, S. G., Alekseeva, E. A.
Format Journal Article
LanguageEnglish
Published New York Allerton Press 01.03.2016
Subjects
Condensed Matter Physics
Mathematical and Computational Physics
Physics
Physics and Astronomy
Theoretical
liquid–vapor interface
ellipsometry
main angle of incidence
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Summary:In this work we describe a method for evaluating such parameters of an interfacial layer as the refractive index and thickness of the liquid–vapor interface, based on the measured ellipticity coefficient, ρ, at different wavelengths of the probing light and the data [1] for several pure fluids. In particular, the change in the main angle of incidence was evaluated in the “layer on the substrate” structure. The surface layer is assumed to be homogeneous.
ISSN:0027-1349
1934-8460
DOI:10.3103/S0027134916010094