High-resolution confocal fluorescence thermal imaging of tightly pumped microchip Nd:YAG laser ceramics

A modified two-path confocal microscope was used to obtain fluorescence images of a Nd:YAG microchip element in the presence of a tightly focused 808 nm pump beam. Based on the temperature-induced homogeneous line broadening, high-resolution (<1 μm, <1°C) thermal images of the pump volume and...

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Bibliographic Details
Published inApplied physics. B, Lasers and optics Vol. 107; no. 3; pp. 697 - 701
Main Authors Benayas, A., Escuder, E., Jaque, D.
Format Journal Article
LanguageEnglish
Published Berlin/Heidelberg Springer-Verlag 01.06.2012
Subjects
Engineering
Lasers
Optical Devices
Optics
Photonics
Physical Chemistry
Physics
Physics and Astronomy
Quantum Optics
Pump Beam
Thermal Image
Thermal Lens
Microchip Laser
Pump Power
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Summary:A modified two-path confocal microscope was used to obtain fluorescence images of a Nd:YAG microchip element in the presence of a tightly focused 808 nm pump beam. Based on the temperature-induced homogeneous line broadening, high-resolution (<1 μm, <1°C) thermal images of the pump volume and surroundings were obtained from the spatial variation of Nd 3+ linewidth. Based on this direct, pure optical and non-contact method, thermal gradients as low as 0.02°C/μm were detected at focal volume, this being in agreement with theoretical predictions. The thermal imaging technique here presented opens the possibility of accurate compensation of thermal effects for the development of stable and efficient microchip lasers.
ISSN:0946-2171
1432-0649
DOI:10.1007/s00340-012-4879-y