X-Ray Imaging Using LEKIDs

We present the detection of 5.9 keV X-rays in a silicon wafer utilising an array of frequency multiplexed Kinetic Inductance Detectors. The readout electronics consists of a programmable digital electronics with an integrated 12-bit ADC, operating with a maximum frequency of 100 MHz. We implement a...

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Bibliographic Details
Published inJournal of low temperature physics Vol. 167; no. 3-4; pp. 311 - 317
Main Authors Cruciani, A., Swenson, L. J., Monfardini, A., Boudou, N., Calvo, M., Roesch, M.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.05.2012
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Summary:We present the detection of 5.9 keV X-rays in a silicon wafer utilising an array of frequency multiplexed Kinetic Inductance Detectors. The readout electronics consists of a programmable digital electronics with an integrated 12-bit ADC, operating with a maximum frequency of 100 MHz. We implement a lumped element geometry, realising pixels as small as possible in order to achieve better position resolution. The whole system allows the simultaneous readout of 14 pixels with a bandwidth of 300 kHz, but it is easily scalable up to 100 pixels. A higher bandwidth detection, with less pixels, allows the reconstruction of the photon absorption position in the substrate up to hundreds of microns. This technological development could be applied in the next future to large area X-Ray Imaging. A better understanding of high energy photon and particle detection is also crucial for the space implementation of LEKIDs for mm-astronomy, where data loss due to Cosmic particles could be a major issue.
ISSN:0022-2291
1573-7357
DOI:10.1007/s10909-012-0549-z