Sizes of test sets for path delay faults using strong and weak non-robust tests
The trade-off between strong and weak non-robust tests for path delay faults considering test quality, test set size and fault coverage is discussed. It is noted that strong non-robust tests detect more combinations of delay defects. However, weak non-robust tests result in smaller test sets, and mo...
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Published in | IET computers & digital techniques Vol. 5; no. 5; pp. 405 - 414 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Stevenage
Institution of Engineering and Technology
01.09.2011
John Wiley & Sons, Inc |
Subjects | |
Online Access | Get full text |
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Summary: | The trade-off between strong and weak non-robust tests for path delay faults considering test quality, test set size and fault coverage is discussed. It is noted that strong non-robust tests detect more combinations of delay defects. However, weak non-robust tests result in smaller test sets, and more path delay faults are detectable by weak non-robust tests. A test generation strategy that mixes strong and weak non-robust tests based on this trade-off is described. Under the proposed strategy, test generation starts by generating strong non-robust tests. When the number of faults detected by each additional test drops below a certain level, indicating that low levels of compaction are achieved, test generation switches to weak non-robust tests. The authors study appropriate switching points experimentally by using a test selection procedure to construct mixed test sets. They also consider the effects of adding power constraints on the mix of strong and weak non-robust tests. |
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Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
ISSN: | 1751-8601 1751-861X |
DOI: | 10.1049/iet-cdt.2010.0049 |