Two-dimensional index profiling of fibers and waveguides
We have constructed a two-dimensional refracted-ray scanner that can resolve index-of-refraction increments of approximately 4 x 10(-5). This resolution is an order of magnitude finer than the uncertainty of the measurement. The scanner can be adapted to evaluate either fibers or planar waveguides....
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| Published in | Applied optics (2004) Vol. 38; no. 33; p. 6836 |
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| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
United States
20.11.1999
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| Online Access | Get more information |
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| Summary: | We have constructed a two-dimensional refracted-ray scanner that can resolve index-of-refraction increments of approximately 4 x 10(-5). This resolution is an order of magnitude finer than the uncertainty of the measurement. The scanner can be adapted to evaluate either fibers or planar waveguides. The two-dimensional scan and the high precision allow visualization of features, such as deposition layers, that are difficult if not impossible to see in conventional one-dimensional scans. |
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| ISSN: | 1559-128X |
| DOI: | 10.1364/AO.38.006836 |