Properties of the adsorption layer in a binary liquid mixture near the critical point

A method for the determination of parameters of the surface layer (thickness and refraction index) at the liquid-vapor interface in binary liquid mixtures was developed. The parameters of the surface layer for the C 7 H 14 -C 7 F 14 liquid mixture in the vicinity of the critical point, which was stu...

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Bibliographic Details
Published inMoscow University physics bulletin Vol. 66; no. 2; pp. 180 - 183
Main Authors Il’ina, S. G., Tret’yakova, I. V., Petrova, V. A.
Format Journal Article
LanguageEnglish
Published Heidelberg Allerton Press, Inc 01.04.2011
Subjects
Mathematical and Computational Physics
Physics
Physics and Astronomy
Theoretical
Adsorption Layer
Perfluoro Carbon
Refraction Index
Hydrodynamic Process
Marangoni Number
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Summary:A method for the determination of parameters of the surface layer (thickness and refraction index) at the liquid-vapor interface in binary liquid mixtures was developed. The parameters of the surface layer for the C 7 H 14 -C 7 F 14 liquid mixture in the vicinity of the critical point, which was studied by means of ellipsometry in [1], were calculated using the proposed method. The temperature dependences of the thickness and refraction index that were determined in the homogeneous isotropic layer approximation at the interface liquid-vapor, show structural peculiarities that were not observed earlier. Their appearance is explained by the possible influence of hydrodynamic processes at the boundary.
ISSN:0027-1349
1934-8460
DOI:10.3103/S0027134911020068