X-ray absorption and VUV spectroscopic studies of silica glasses irradiated in a nuclear reactor

X-ray absorption technique (XANES and EXAFS) was applied to the analysis of local structures of the fused and synthesized silica glasses before and after the neutron irradiation in a nuclear reactor. Si K-edge EXAFS revealed that the number of oxygen atoms coordinated with Si increases after irradia...

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Published inJournal of electron spectroscopy and related phenomena Vol. 119; no. 2; pp. 221 - 227
Main Authors Yoshida, Tomoko, Tanabe, Tetsuo, Yoshida, Hisao, Ii, Tatsuya
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.08.2001
Subjects
Neutron irradiation
Oxygen deficiencies
Silica glass
VUV spectroscopy
XAFS
Silica glass
Neutron irradiation
Oxygen deficiencies
XAFS
VUV spectroscopy
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Summary:X-ray absorption technique (XANES and EXAFS) was applied to the analysis of local structures of the fused and synthesized silica glasses before and after the neutron irradiation in a nuclear reactor. Si K-edge EXAFS revealed that the number of oxygen atoms coordinated with Si increases after irradiation. This result indicates the induction of structural relaxation such that some of bonds connecting SiO 4 units are broken and Si atoms are likely to form regular SiO 4 tetrahedral bonds. On the other hand, photoluminescence (PL) and optical absorption measurements clearly showed different features about oxygen vacancies in these samples. B 2β type oxygen-deficient center exists as a main intrinsic defect in the fused-silica glass, while another type B 2α center is formed in the synthesized silica glass.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0368-2048
1873-2526
DOI:10.1016/S0368-2048(01)00296-1