Structural characterization of phosphide and related semiconductor nanoclusters

Semiconductor nanoclusters of InP, Cd 3P 2, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniq...

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Bibliographic Details
Published inNanostructured materials Vol. 3; no. 1; pp. 239 - 244
Main Authors Viano, A.M., Gibbons, P.C., Buhro, W.E., Goel, S.C., Matchett, M.A.
Format Journal Article
LanguageEnglish
Published Elsevier Science 1993
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Summary:Semiconductor nanoclusters of InP, Cd 3P 2, and CdS have been synthesized and analyzed to determine size distribution, composition, and core crystallinity. Transmission electron microscope (TEM) images show particles whose size distribution can be measured using manual and computer-automated techniques. Diffraction and high-resolution imaging have been used to study core crystallinity. Crystalline Cd 3P 2, CdS and amorphous Cd 3P 2, InP, and CdS nanoparticles in the 1 nm - 10 nm size range have been obtained.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0965-9773
1872-9150
DOI:10.1016/0965-9773(93)90085-P