Relationship between initial and time-dependent cracks in charge transport of solution-processed organic thin-film transistor

We report on the comprehensive effect of initial and time-dependent crack on the charge transport of 6, 13-bis (triisopropylsilyethynyl) pentacene (TIPS-PEN) thin-film transistors (TFTs) upon exposure to air. Among the two types of TIPS-PEN films, with and without initial thermal cracks, temporally...

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Bibliographic Details
Published inMolecular Crystals and Liquid Crystals Vol. 653; no. 1; pp. 238 - 242
Main Authors Jung, Ji-Hoon, Kim, Young-Rae, Choe, Eunji, Song, Dong-Seok, Bae, Jin-Hyuk
Format Journal Article
LanguageEnglish
Published Philadelphia Taylor & Francis 13.08.2017
Taylor & Francis Ltd
Subjects
Charge transport
Crack
Crack propagation
Cracks
Crystals
Exposure
Molecular structure
organic semiconductor
Semiconductor devices
solution-process
Thin film transistors
thin-film
Time dependence
Tips
transistor
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Summary:We report on the comprehensive effect of initial and time-dependent crack on the charge transport of 6, 13-bis (triisopropylsilyethynyl) pentacene (TIPS-PEN) thin-film transistors (TFTs) upon exposure to air. Among the two types of TIPS-PEN films, with and without initial thermal cracks, temporally generated cracks were found to be severely affected by the initial status of the thermal cracks upon air-exposure. After 12 months of air-exposure, the charge transport characteristics of TIPS-PEN TFTs with initial thermal cracks degraded up to 98%, while those without initial thermal cracks degraded only 88%. Based on our long-term experimental results, we conclude that the initial physical status of the cracks play a significant role in the growth of time-dependent cracks and the capability of charge transport in solution-processed TFTs.
ISSN:1542-1406
1563-5287
1527-1943
DOI:10.1080/15421406.2017.1352437