Ballistic current in metal-oxide-semiconductor field-effect transistors: The role of device topology

• Published in: Journal of applied physics Vol. 106; no. 5; pp. 053702 - 053702-8
• Main Authors: Pourghaderi, M. Ali, Magnus, Wim, Sorée, Bart, Meuris, Marc, De Meyer, Kristin, Heyns, Marc
• Format: Journal Article
• Language: English
• Published: American Institute of Physics 01.09.2009
• ISSN: 0021-8979; 1089-7550
• DOI: 10.1063/1.3197635

In this study we investigate the effect of device topology on the ballistic current in n -channel metal-oxide-semiconductor field-effect transistors. Comparison of the nanoscale planar and double-gate devices reveals that, down to a certain thickness of the double gate film, the ballistic current flowing in the double gate device is twice as large compared to its planar counterpart. On the other hand, further thinning of the film beyond this threshold is found to change noticeably the confinement and transport characteristics, which are strongly depending on the film material and the surface orientation. For double gate Ge and Si devices there exists a critical film thickness below which the transverse gate field is no longer effectively screened by the inversion layer electron gas and mutual inversion of the two gates is turned on. In the case of GaAs and other similar III-V compounds, a decrease in the film thickness may drastically change the occupation of the L -valleys and therefore amend the transport properties. The simulation results show that, in both cases, the ballistic current and the transconductance are considerably enhanced.