Damage induced by monochromatic synchrotron X-rays at the resonance absorption energy of intracellular phosphorous in yeast cells

Two key experiments are analysed in terms of track structure parameters to obtain information on the excessive damage observed upon the production of inner shell vacancies at the resonance energy of bound phosphorus (Kobayashi et al., 1991) and for bromine incorporated into DNA (Usami et al., 1991)....

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Published inApplied radiation and isotopes Vol. 45; no. 7; pp. 767 - 772
Main Authors Jin, T., Watt, D.E., Kobayashi, K.
Format Journal Article
LanguageEnglish
Published England Elsevier Ltd 1994
Subjects
Bromine
DNA Damage
DNA, Fungal - radiation effects
Mathematics
Models, Theoretical
Phosphorus
Saccharomyces cerevisiae
Saccharomyces cerevisiae - radiation effects
Synchrotrons
X-Rays
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Summary:Two key experiments are analysed in terms of track structure parameters to obtain information on the excessive damage observed upon the production of inner shell vacancies at the resonance energy of bound phosphorus (Kobayashi et al., 1991) and for bromine incorporated into DNA (Usami et al., 1991). The relative damage enhancement factor due to resonance in phosphorus is 1.32. Additional Auger electron cascade events induced at resonance contribute about 35% to the total effect cross-section. In the bromine experiments, the intrinsic effectiveness is shown to be less than that for phosphorus. The effects can be quantified by the equilibrium electron fluences generated, combined with a quality specification determined from the net mean free path for ionization.
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ISSN:0969-8043
1872-9800
DOI:10.1016/0969-8043(94)90127-9