Direct solids analysis using sputter initiated resonance ionization spectroscopy (Siris)
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Published in | Journal of research of the National Bureau of Standards (1977) Vol. 93; no. 3; pp. 383 - 385 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology
01.05.1988
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Online Access | Get full text |
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ISSN: | 0160-1741 2376-5259 |
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DOI: | 10.6028/jres.093.086 |