A Robust Silicon-on-Insulator Static-Random-Access-Memory Architecture by using Advanced Actively Body-Bias Controlled Technology

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Bibliographic Details
Published in	Japanese Journal of Applied Physics Vol. 47; no. 4R; p. 2092
Main Authors	Hirano, Yuuichi, Tsujiuchi, Mikio, Ishikawa, Kozo, Shinohara, Hirofumi, Terada, Takashi, Maki, Yukio, Iwamatsu, Toshiaki, Eikyu, Katsumi, Uchida, Tetsuya, Obayashi, Shigeki, Nii, Koji, Tsukamoto, Yasumasa, Yabuuchi, Makoto, Ipposhi, Takashi, Oda, Hidekazu, Inoue, Yasuo
Format	Journal Article
Language	English
Published	01.04.2008
Online Access	Get full text

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ISSN:	0021-4922 1347-4065
DOI:	10.1143/JJAP.47.2092