Micro-structural analysis of YBa2Cu3O7−x thin films grown on different substrates by X-ray techniques
YBa2Cu3Ox (YBCO) thin films grown on different substrates with and/or without Eu2CuO4 (ECO) buffer layer were investigated by X-ray wide angle diffraction, reflection, diffuse scattering and topography. Results show that for YSZ substrate, the presence of an ECO buffer layer improves the crystalline...
Saved in:
Published in | Physica. C, Superconductivity Vol. 361; no. 4; pp. 260 - 266 |
---|---|
Main Authors | , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
01.10.2001
|
Online Access | Get full text |
Cover
Loading…
Be the first to leave a comment!