Micro-structural analysis of YBa2Cu3O7−x thin films grown on different substrates by X-ray techniques

YBa2Cu3Ox (YBCO) thin films grown on different substrates with and/or without Eu2CuO4 (ECO) buffer layer were investigated by X-ray wide angle diffraction, reflection, diffuse scattering and topography. Results show that for YSZ substrate, the presence of an ECO buffer layer improves the crystalline...

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Bibliographic Details
Published inPhysica. C, Superconductivity Vol. 361; no. 4; pp. 260 - 266
Main Authors Liu, C.X., Xu, M., Tang, W.H., Chen, X.M., Wu, L.S., Yang, N., Mai, Z.H., Tao, K., Gao, J.
Format Journal Article
LanguageEnglish
Published 01.10.2001
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