Micro-structural analysis of YBa2Cu3O7−x thin films grown on different substrates by X-ray techniques

YBa2Cu3Ox (YBCO) thin films grown on different substrates with and/or without Eu2CuO4 (ECO) buffer layer were investigated by X-ray wide angle diffraction, reflection, diffuse scattering and topography. Results show that for YSZ substrate, the presence of an ECO buffer layer improves the crystalline...

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Published inPhysica. C, Superconductivity Vol. 361; no. 4; pp. 260 - 266
Main Authors Liu, C.X., Xu, M., Tang, W.H., Chen, X.M., Wu, L.S., Yang, N., Mai, Z.H., Tao, K., Gao, J.
Format Journal Article
LanguageEnglish
Published 01.10.2001
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Summary:YBa2Cu3Ox (YBCO) thin films grown on different substrates with and/or without Eu2CuO4 (ECO) buffer layer were investigated by X-ray wide angle diffraction, reflection, diffuse scattering and topography. Results show that for YSZ substrate, the presence of an ECO buffer layer improves the crystalline quality of the YBCO film, while a negative effect is observed for the SrTiO3 (STO) substrate. The lateral correlation length for a sample grown on a YSZ substrate with ECO buffer layer is greater than that grown on an STO substrate. The STO substrate used has mosaic structure. 11 refs.
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ISSN:0921-4534
DOI:10.1016/S0921-4534(01)00418-X