Effects of spacer layers on magnetic properties and exchange couplings of Nd-Fe-B/Nd-Ce-Fe-B multilayer films

The influences of the spacer-layer Ta on the structures and magnetic properties of NdFeB/NdCeFeB multilayer films are investigated via DC sputtering under an Ar pressure of 1.2 Pa. An obvious (00l) texture of the hard phase is observed in each of the films, which indicates that the main phase of the...

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Published inChinese physics B Vol. 26; no. 10; pp. 438 - 441
Main Author 孙亚超 朱明刚 刘伟 韩瑞 张文臣 李岩峰 李卫
Format Journal Article
LanguageEnglish
Published 01.10.2017
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Summary:The influences of the spacer-layer Ta on the structures and magnetic properties of NdFeB/NdCeFeB multilayer films are investigated via DC sputtering under an Ar pressure of 1.2 Pa. An obvious (00l) texture of the hard phase is observed in each of the films, which indicates that the main phase of the film does not significantly change with Ta spacer-layer thickness. As a result, both the remanence and the saturation magnetization of the magnet first increase and then decrease, and the maximum values of 4π Mr and Hcj are 10.4 kGs (1 Gs=10^-4 T) and 15.0 kOe (1 Oe=79.5775 A·m^-1) for the film with a 2-nm-thick Ta spacer-layer, respectively, where the crystalline structures are columnar shape particles. The measured relationship between irreversible portion D (H)=-△ Mirr/2Mr and H indicates that the nucleation field of the film decreases with spacer layer thickness increasing, owing to slightly disordered grains near the interface between different magnetic layers.
Bibliography:Ya-Chao Sun1, Ming-Gang Zhu1, Wei Liu2, Rui Han1, Wen-Chen Zhang1, Yan-Feng Li1, Wei Li1( 1 Division of Functional Materials, Central Iron & Steel Research Institute, Beijing 100081, China ;2 Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China)
The influences of the spacer-layer Ta on the structures and magnetic properties of NdFeB/NdCeFeB multilayer films are investigated via DC sputtering under an Ar pressure of 1.2 Pa. An obvious (00l) texture of the hard phase is observed in each of the films, which indicates that the main phase of the film does not significantly change with Ta spacer-layer thickness. As a result, both the remanence and the saturation magnetization of the magnet first increase and then decrease, and the maximum values of 4π Mr and Hcj are 10.4 kGs (1 Gs=10^-4 T) and 15.0 kOe (1 Oe=79.5775 A·m^-1) for the film with a 2-nm-thick Ta spacer-layer, respectively, where the crystalline structures are columnar shape particles. The measured relationship between irreversible portion D (H)=-△ Mirr/2Mr and H indicates that the nucleation field of the film decreases with spacer layer thickness increasing, owing to slightly disordered grains near the interface between different magnetic layers.
permanent magnets, multilayer films, spacer layer, irreversible
11-5639/O4
ISSN:1674-1056
2058-3834
DOI:10.1088/1674-1056/26/10/107501