Room-temperature 1.54-μm electroluminescence from Er-doped Si-rich SiO2 films deposited on p-Si by magnetron sputtering

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Bibliographic Details
Published inThin solid films Vol. 409; no. 2; pp. 194 - 197
Main Authors YUAN, F. C, RAN, G. Z, CHEN, Y, DAI, L, QIAO, Y. P, MA, Z. C, ZONG, W. H, QIN, G. G
Format Journal Article
LanguageEnglish
Published Lausanne Elsevier Science 30.04.2002
Subjects
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Exact sciences and technology
Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation
Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures
Optical properties of nanoscale materials and structures
Physics
Thin films
Stoichiometry
Annealing
Semiconductor materials
Impurities
Silicon oxides
Light emitting diodes
Electroluminescence
Nanostructures
Experimental study
Erbium additions
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ISSN:0040-6090
1879-2731
DOI:10.1016/S0040-6090(02)00069-X