Electrical properties of pulsed laser-deposited SrxBiyTa2O9 thin films on Bi/Sr ratios

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Bibliographic Details
Published inSolid state communications Vol. 127; no. 4; pp. 315 - 318
Main Authors PARK, Jong-Ho, KIM, Chung-Sik, CHOI, Byung-Chun, JEONG, Jung-Hyun, BYUNG KEE MOON, SEO, Hyo-Jin, KIM, Ill-Won, KIM, Jin-Soo
Format Journal Article
LanguageEnglish
Published Oxford Elsevier 01.07.2003
Subjects
Condensed matter: electronic structure, electrical, magnetic, and optical properties
Dielectrics, piezoelectrics, and ferroelectrics and their properties
Domain structure; hysteresis
Exact sciences and technology
Ferroelectricity and antiferroelectricity
Physics
Grain boundaries
Atomic force microscopy
Polarization
Frequency dependence
D. Dielectric response
Inorganic compounds
77.22.Gm
Thin films
Coercive force
Chemical composition
77.84.Dy
Quaternary compounds
Ferroelectric hysteresis
Grain size
Transition element compounds
Tantalum oxides
Bismuth oxides
Pulsed laser deposition
Experimental study
Strontium oxides
66.10.Ed A. Thin films
Ferroelectric materials
Non linear effect
Microstructure
Electric impedance
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ISSN:0038-1098
1879-2766
DOI:10.1016/S0038-1098(03)00433-2