Low-Frequency Noise in Gate Tunable Topological Insulator Nanowire Field Emission Transistor near the Dirac Point

• Published in: Chinese physics letters Vol. 33; no. 8; pp. 109 - 112
• Main Author: 张浩 宋志军 冯军雅 姬忠庆 吕力
• Format: Journal Article
• Language: English
• Published: 01.08.2016
• Subjects: 低频噪声; 可调; 场发射; 拓扑; 晶体管; 狄拉克; 纳米线; 绝缘体

Low-frequency flicker noise is usually associated with material defects or imperfection of fabrication procedure. Up to now, there is only very limited knowledge about flicker noise of the topological insulator, whose topologically protected conducting surface is theoretically immune to back scatter...