Electromagnetically induced grating in a thermal N-type four-level atomic system
The electromagnetically induced grating effect in thermal and cold atoms has been studied theoretically. Studies have shown that, by adjusting the parameters, the first-order diffraction efficiency of the probe beam in the cold atomic system and the thermal atomic system is 34% and 31%, respectively...
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| Published in | Chinese physics B Vol. 26; no. 1; pp. 194 - 199 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
2017
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| Subjects | |
| Online Access | Get full text |
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| Summary: | The electromagnetically induced grating effect in thermal and cold atoms has been studied theoretically. Studies have shown that, by adjusting the parameters, the first-order diffraction efficiency of the probe beam in the cold atomic system and the thermal atomic system is 34% and 31%, respectively, which is very close to the ideal diffraction efficiency of the sinusoidal grating. However, it is more difficult to prepare the cold atomic system than to prepare the thermal atomic system in the practical application, so the study of the electromagnetically induced grating effect in the thermal atomic system may be helpful for practical applications. |
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| Bibliography: | The electromagnetically induced grating effect in thermal and cold atoms has been studied theoretically. Studies have shown that, by adjusting the parameters, the first-order diffraction efficiency of the probe beam in the cold atomic system and the thermal atomic system is 34% and 31%, respectively, which is very close to the ideal diffraction efficiency of the sinusoidal grating. However, it is more difficult to prepare the cold atomic system than to prepare the thermal atomic system in the practical application, so the study of the electromagnetically induced grating effect in the thermal atomic system may be helpful for practical applications. 11-5639/O4 electromagnetically induced grating; phase modulation; first-order diffraction efficiency; thermal atomic system Ya-Bin Dong,Jun-Yan Li,Zhi-Ying Zhou（ Department of Physics, Shanxi University, Taiyuan 030006, China） |
| ISSN: | 1674-1056 2058-3834 |
| DOI: | 10.1088/1674-1056/26/1/014202 |