Adsorption of titanium, chromium, and copper atoms on thin aluminum and magnesium oxide film surfaces

Methods of Auger electron spectroscopy (AES), spectroscopy of characteristic electron energy losses (SCEEL), slow electron diffraction (SED), and contact potential difference (CPD) in ultrahigh vacuum are used to investigate the adsorption-emission properties and stability of two-component film syst...

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Bibliographic Details
Published inRussian physics journal Vol. 54; no. 11; pp. 1226 - 1231
Main Authors Tvauri, I. V., Turiev, A. M., Tsidaeva, N. I., Gazzaeva, M. E., Vladimirov, G. G., Magkoev, T. T.
Format Journal Article
LanguageEnglish
Published Boston Springer US 01.04.2012
Springer
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Summary:Methods of Auger electron spectroscopy (AES), spectroscopy of characteristic electron energy losses (SCEEL), slow electron diffraction (SED), and contact potential difference (CPD) in ultrahigh vacuum are used to investigate the adsorption-emission properties and stability of two-component film systems formed by putting of Ti, Cr, and Cu atoms on MgO–Mo(011) and Al 2 O 3 –Mo(011) surfaces. All atoms have the properties of electronegative adsorbates. Continuous adatom monolayers are formed on the Al 2 O 3 –Mo(011) system surface, and three-dimensional islands are formed on the MgO–Mo(011) surface. The properties of monoatomic films on the oxide layer surface are close to those observed for bulk materials. No radical changes of the system properties are detected with increasing dielectric layer thickness. The thermal stability of the newly formed structures decreases in the order Ti, Cr, Cu, Al 2 O 3 (MgO), and Mo(011).
ISSN:1064-8887
1573-9228
DOI:10.1007/s11182-012-9735-3