Reversible phase change in BixSe100-x chalcogenide thin films for using as optical recording medium

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Bibliographic Details
Published inApplied surface science Vol. 171; no. 3-4; pp. 231 - 241
Main Authors HAFIZ, M. M, EL-SHAZLY, O, KINAWY, N
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier Science 15.02.2001
Subjects
Cross-disciplinary physics: materials science; rheology
Exact sciences and technology
Ion and electron beam-assisted deposition; ion plating
Materials science
Methods of deposition of films and coatings; film growth and epitaxy
Physics
Temperature dependence
Crystalline phase
Metals Compounds
Semiconductor thin films
Phase transformations
Electron diffraction
Electron beam deposition
Absorption coefficients
Transmittance
Chalcogenide glasses
Bismuth selenides
Optical properties
Amorphous state structure
TEM
Reflectance
Crystal structure
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ISSN:0169-4332
1873-5584
DOI:10.1016/S0169-4332(00)00709-1