Thickness study of Al:ZnO film for application as a window layer in Cu(In1−xGax)Se2 thin film solar cell
▶ Structural, electrical and optical properties of various Al:ZnO thin film were studied. ▶ Electrical and structural properties of Al:ZnO film improved with increasing its thickness, ▶ The optical properties of Al:ZnO film degraded with thickness. ▶Jsc of the CIGS solar cell was influenced by Al:Zn...
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Published in | Applied surface science Vol. 257; no. 9; pp. 4026 - 4030 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Amsterdam
Elsevier B.V
15.02.2011
Elsevier |
Subjects | |
Online Access | Get full text |
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Summary: | ▶ Structural, electrical and optical properties of various Al:ZnO thin film were studied. ▶ Electrical and structural properties of Al:ZnO film improved with increasing its thickness, ▶ The optical properties of Al:ZnO film degraded with thickness. ▶Jsc of the CIGS solar cell was influenced by Al:ZnO layer thickness. ▶ Electrically and optically optimized Al:ZnO window give best efficiency solar cell.
Structural, electrical and optical properties of Al doped ZnO (Al:ZnO) thin film of various thicknesses, grown by radio-frequency magnetron sputtering system were studied in relation to the application as a window layer in Cu(In1−xGax)Se2 (CIGS) thin film solar cell. It was found that the electrical and structural properties of Al:ZnO film improved with increasing its thickness, however, the optical properties degraded. The short circuit current density, Jsc of the fabricated CIGS based solar cells was significantly influenced by the variation of the Al:ZnO window layer thickness. Best efficiency was obtained when CIGS solar cell was fabricated with electrically and optically optimized Al:ZnO window layer. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0169-4332 1873-5584 |
DOI: | 10.1016/j.apsusc.2010.11.169 |