Characterization of GaAs/Ga1-xAlxAs multilayer systems by infrared spectroscopy at normal incidence
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Published in | Solid state communications Vol. 87; no. 11; pp. 1039 - 1044 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Oxford
Elsevier
01.09.1993
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Subjects | |
Online Access | Get full text |
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ISSN: | 0038-1098 1879-2766 |
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DOI: | 10.1016/0038-1098(93)90557-4 |