Freeform surface measurement and characterisation using a toolmakers microscope
Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI).The following novel features are addressed: ▪ Feature recognition and extraction...
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Published in | Journal of physics. Conference series Vol. 483; no. 1; p. 12004 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Bristol
IOP Publishing
28.03.2014
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Subjects | |
Online Access | Get full text |
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Summary: | Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI).The following novel features are addressed: ▪ Feature recognition and extraction from surface data ▪ Characterisation of properties of the surface's M and N vectors at individual vertex ▪ Development of a measuring plan using a toolmakers microscope for the inspection of the FFS ▪ Inspection of the actual FFS produced by CNC milling ▪ Verification of the measurement results and comparison with the CAD design data Tests have shown that the deviations between the CAI and CAD data were within the estimated uncertainty limits. |
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ISSN: | 1742-6596 1742-6588 1742-6596 |
DOI: | 10.1088/1742-6596/483/1/012004 |