Freeform surface measurement and characterisation using a toolmakers microscope

Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI).The following novel features are addressed: ▪ Feature recognition and extraction...

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Bibliographic Details
Published inJournal of physics. Conference series Vol. 483; no. 1; p. 12004
Main Authors Wong, Francis Seung-yin, Chauh, Kong-Bieng, Venuvinod, Patri K
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 28.03.2014
Subjects
CAD
CAD/CAM
Computer aided design
Feature extraction
Feature recognition
Inspection
Physics
Surface geometry
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Summary:Current freeform surface (FFS) characterization systems mainly cover aspects related to computer-aided design/manufacture (CAD/CAM). This paper describes a new approach that extends into computer-aided inspection (CAI).The following novel features are addressed: ▪ Feature recognition and extraction from surface data ▪ Characterisation of properties of the surface's M and N vectors at individual vertex ▪ Development of a measuring plan using a toolmakers microscope for the inspection of the FFS ▪ Inspection of the actual FFS produced by CNC milling ▪ Verification of the measurement results and comparison with the CAD design data Tests have shown that the deviations between the CAI and CAD data were within the estimated uncertainty limits.
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/483/1/012004